IEEE - Institute of Electrical and Electronics Engineers, Inc. - Study on Foundation of Simulation Test Bed for Uncertainty in SCM

2007 IEEE International Conference on Automation and Logistics

Author(s): Dawei Liu ; Yongquan Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2007
Conference Location: Jinan, China
Conference Date: 18 August 2007
Page(s): 1,509 - 1,514
ISBN (Paper): 978-1-4244-1531-1
DOI: 10.1109/ICAL.2007.4338810
Regular:

The study on the development of guidelines to select appropriate strategies and to improve the performance when given a particular strategy became a critical question in supply chain management... View More

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