IEEE - Institute of Electrical and Electronics Engineers, Inc. - Static Characterization of High Resolution DAC Based on Over Sampling and Low Resolution ADC

2007 IEEE Instrumentation and Measurement Technology Conference

Author(s): D.L. Carni ; D. Grimaldi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Warsaw, Poland
Conference Date: 1 May 2007
Page(s): 1 - 6
ISBN (CD): 1-4244-1080-0
ISBN (Paper): 1-4244-0588-2
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2007.379399
Regular:

A new method is presented for the static characterization of high resolution digital to analog converters (DAC). The method is based on the comparison of the DAC output voltage signal with a... View More

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