IEEE - Institute of Electrical and Electronics Engineers, Inc. - Environmental Stress Screening for electronic equipment by random vibration: a critical approach to reliability estimation and planning

2007 IEEE Instrumentation and Measurement Technology Conference

Author(s): M. Catelani ; V. Scarano ; I. Trotta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Warsaw, Poland
Conference Date: 1 May 2007
Page(s): 1 - 5
ISBN (CD): 1-4244-1080-0
ISBN (Paper): 1-4244-0588-2
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2007.379085
Regular:

Individuated a deficiency of manufacturing practice and standards in environmental stress screening, ESS, we proposed a process of screening with random vibrations in which the time of test is... View More

Advertisement