IEEE - Institute of Electrical and Electronics Engineers, Inc. - Error Modeling of a Fast Digital Integrator for Magnetic Measurements at CERN

2007 IEEE Instrumentation and Measurement Technology Conference

Author(s): P. Arpaia ; V. Inglese ; G. Spiezia ; S. Tiso
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Warsaw, Poland
Conference Date: 1 May 2007
Page(s): 1 - 6
ISBN (CD): 1-4244-1080-0
ISBN (Paper): 1-4244-0588-2
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2007.379048
Regular:

A statistical behavioral modeling approach for assessing dynamic metrological performance during the concept design of accurate digitizers is proposed. A surface-response approach based on... View More

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