IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nonlinear Correlation Measurement Based Registration for Sequential Images

2007 IEEE Instrumentation and Measurement Technology Conference

Author(s): Jing Jin ; Qiang Wang ; Yi Shen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Warsaw, Poland
Conference Date: 1 May 2007
Page(s): 1 - 5
ISBN (CD): 1-4244-1080-0
ISBN (Paper): 1-4244-0588-2
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2007.379112
Regular:

Registration for sequential images has significant meanings in clinical diagnosis and analysis. Many researches are concentrated on using higher-order mutual information (HMI) to fulfill the... View More

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