IEEE - Institute of Electrical and Electronics Engineers, Inc. - A System for the Measurement of the Temperature Dependence Performances of Quartz Oscillators: a Study of the Analytical Model of the Failure Rate

2007 IEEE Instrumentation and Measurement Technology Conference

Author(s): L. Peretto ; P. Rinaldi ; C. Duri
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Warsaw, Poland
Conference Date: 1 May 2007
Page(s): 1 - 6
ISBN (CD): 1-4244-1080-0
ISBN (Paper): 1-4244-0588-2
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2007.379063
Regular:

This paper presents a method of investigation of the temperature dependence of the accuracy performances of quartz oscillators. Temperature effects may vary widely in significance depending on the... View More

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