IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparative Analysis of Process Variation Impact on Flip-Flop Power-Performance

2007 IEEE International Symposium on Circuits and Systems (ISCAS)

Author(s): M. Hansson ; A. Alvandpour
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: New Orleans, LA, USA
Conference Date: 27 May 2007
Page(s): 3,744 - 3,747
ISBN (CD): 1-4244-0921-7
ISBN (Paper): 1-4244-0920-9
ISSN (Electronic): 2158-1525
ISSN (Paper): 0271-4302
DOI: 10.1109/ISCAS.2007.378775
Regular:

This paper presents an analysis of process variation impact on four flip-flops in 90-nm CMOS. The analyzed flip-flops are compared for required delay overhead and timing uncertainty. The analysis... View More

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