IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ensemble Dependent Matrix Methodology for Probabilistic-Based Fault-tolerant Nanoscale Circuit Design

2007 IEEE International Symposium on Circuits and Systems (ISCAS)

Author(s): Huifei Rao ; Jie Chen ; Changhong Yu ; Woon Tiong Ang ; I-Chyn Wey ; An-Yeu Wu ; Hong Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: New Orleans, LA, USA
Conference Date: 27 May 2007
Page(s): 1,803 - 1,806
ISBN (CD): 1-4244-0921-7
ISBN (Paper): 1-4244-0920-9
ISSN (Electronic): 2158-1525
ISSN (Paper): 0271-4302
DOI: 10.1109/ISCAS.2007.378023
Regular:

Two probabilistic-based models, namely the ensemble-dependent matrix model (Chen and Li, 2006), (Patel et al., 2003) and the Markov random field model (Chen et al., 2003), have been proposed to... View More

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