IEEE - Institute of Electrical and Electronics Engineers, Inc. - Embedded Jitter Measurement of High-speed I/O Signals

2007 IEEE International Symposium on Circuits and Systems (ISCAS)

Author(s): Xueqing Wang ; W.R. Eisenstadt ; R.M. Fox
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: New Orleans, LA, USA
Conference Date: 27 May 2007
Page(s): 153 - 156
ISBN (CD): 1-4244-0921-7
ISBN (Paper): 1-4244-0920-9
ISSN (Electronic): 2158-1525
ISSN (Paper): 0271-4302
DOI: 10.1109/ISCAS.2007.378244
Regular:

In this paper, an embedded jitter measurement system is presented. The system uses the Vernier delay method to achieve high resolution. The jitter test circuit is implemented using current-mode... View More

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