IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accurate Inductance De-embedding Technique for Scalable Inductor Models

IEEE International Conference on Microelectronic Test Structures, ICMTS 2007

Author(s): V. Blaschke ; J. Victory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: Tokyo, Japan
Conference Date: 19 March 2007
Page(s): 248 - 252
ISBN (CD): 1-4244-0781-8
ISBN (Paper): 1-4244-0780-X
DOI: 10.1109/ICMTS.2007.374493
Regular:

Scalable models for circuit design components such as inductors are a requirement for state of the art design environments. Accurate Spice-level modeling requires physical based models and an... View More

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