IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scalable approach for external collector resistance calculation

IEEE International Conference on Microelectronic Test Structures, ICMTS 2007

Author(s): C. Raya ; N. Kauffmann ; F. Pourchon ; D. Celi ; T. Zimmer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: Tokyo, Japan
Conference Date: 19 March 2007
Page(s): 101 - 106
ISBN (CD): 1-4244-0781-8
ISBN (Paper): 1-4244-0780-X
DOI: 10.1109/ICMTS.2007.374464
Regular:

For device modelling purposes, the geometry dependence of the external collector resistance has been investigated. Firstly, the collector resistance is split into a perfectly 1D vertical... View More

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