IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Precise Resistance Tracing Technique for a Toggle Mode MRAM Evaluation

IEEE International Conference on Microelectronic Test Structures, ICMTS 2007

Author(s): Y. Katoh ; K. Tsuji ; H. Hada ; N. Kasai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: Tokyo, Japan
Conference Date: 19 March 2007
Page(s): 51 - 54
ISBN (CD): 1-4244-0781-8
ISBN (Paper): 1-4244-0780-X
DOI: 10.1109/ICMTS.2007.374453
Regular:

A precise evaluation technique was created for developing magnetic random access memory (MRAM), especially memory that operates in a toggle-writing mode. This technique enables us to observe the... View More

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