IEEE - Institute of Electrical and Electronics Engineers, Inc. - Implications of Rent's Rule for NoC Design and Its Fault-Tolerance

2007 International Symposium on Networks-on-Chip

Author(s): D. Greenfield ; A. Banerjee ; J.-G. Lee ; S. Moore
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2007
Conference Location: Princeton, NJ, USA
Conference Date: 7 May 2007
Page(s): 283 - 294
ISBN (Paper): 0-7695-2773-6
DOI: 10.1109/NOCS.2007.26
Regular:

Rent's rule is a powerful tool for exploring VLSI design and technology scaling issues. This paper applies the principles of Rent's rule to the analysis of networks-on-chip (NoC). In particular, a... View More

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