IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Dictionary Size Reduction for Million-Gate Large Circuits

2007 Asia and South Pacific Design Automation Conference

Author(s): Yu-Ru Hong ; Juinn-Dar Huang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Yokohama, Japan
Conference Date: 23 January 2007
Page(s): 829 - 834
ISBN (CD): 1-4244-0630-7
ISBN (Paper): 1-4244-0629-3
DOI: 10.1109/ASPDAC.2007.358092
Regular:

In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might... View More

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