IEEE - Institute of Electrical and Electronics Engineers, Inc. - Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes

2007 Asia and South Pacific Design Automation Conference

Author(s): Zhuo Zhang ; S.M. Reddy ; I. Pomeranz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Yokohama, Japan
Conference Date: 23 January 2007
Page(s): 817 - 822
ISBN (CD): 1-4244-0630-7
ISBN (Paper): 1-4244-0629-3
DOI: 10.1109/ASPDAC.2007.358090
Regular:

Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift test method has the... View More

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