IEEE - Institute of Electrical and Electronics Engineers, Inc. - N-SIFT: N-DIMENSIONAL SCALE INVARIANT FEATURE TRANSFORM FOR MATCHING MEDICAL IMAGES

2007 4th IEEE International Symposium on Biomedical Imaging: Macro to Nano

Author(s): W. Cheung ; G. Hamarneh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2007
Conference Location: Arlington, VA, USA
Conference Date: 12 April 2007
Page(s): 720 - 723
ISBN (CD): 1-4244-0672-2
ISBN (Paper): 1-4244-0671-4
DOI: 10.1109/ISBI.2007.356953
Regular:

We present a fully automated multimodal medical image matching technique. Our method extends the concepts used in the computer vision SIFT technique for extracting and matching distinctive scale... View More

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