IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Non-local Maximum-Likelihood Denoising Algorithm

2007 IEEE Aerospace Conference

Author(s): M.D. Sambora
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: Big Sky, MT, USA
Conference Date: 3 March 2007
Page(s): 1 - 7
ISBN (CD): 1-4244-0525-4
ISBN (Paper): 1-4244-0524-6
ISSN (Paper): 1095-323X
DOI: 10.1109/AERO.2007.353029
Regular:

Digital images obtained using CCD or CMOS sensors are subject to corruption by AWGN noise during sensor readout. Most of the techniques used for noise reduction in images have relied on methods... View More

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