IEEE - Institute of Electrical and Electronics Engineers, Inc. - UT-Scope: Speech under Lombard Effect and Cognitive Stress

2007 IEEE Aerospace Conference

Author(s): A. Ikeno ; V. Varadarajan ; S. Patil ; J.H.L. Hansen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: Big Sky, MT, USA
Conference Date: 3 March 2007
Page(s): 1 - 7
ISBN (CD): 1-4244-0525-4
ISBN (Paper): 1-4244-0524-6
ISSN (Paper): 1095-323X
DOI: 10.1109/AERO.2007.352975
Regular:

This paper presents UT-scope data base, and automatic and perceptual an evaluation of Lombard speech in in-set speaker recognition. The speech used for the analysis forms a part of the UT-SCOPE... View More

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