IEEE - Institute of Electrical and Electronics Engineers, Inc. - Technological Scaling and Minimization of 1/fNoise in SiGe HBTs Coupled Mode N-Push Oscillators/VCOs

2007 IEEE Radio and Wireless Symposium

Author(s): U.L. Rohde ; A.K. Poddar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Long Beach, CA, USA
Conference Date: 9 January 2007
Page(s): 47 - 50
ISBN (CD): 1-4244-0445-2
ISBN (Paper): 1-4244-0444-4
DOI: 10.1109/RWS.2007.351754
Regular:

This paper investigates the impact of technological scaling and minimization of flicker (1/f) noise on SiGe HBTs in coupled mode N-push oscillator/VCO configuration, which have recently emerged as... View More

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