IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel Half-Adder Using Single Electron Tunneling Technology

2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems

Author(s): S.E. Rehan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Bangkok, Thailand
Conference Date: 16 January 2007
Page(s): 245 - 249
ISBN (Paper): 1-4244-0610-2
DOI: 10.1109/NEMS.2007.352018
Regular:

Single electron tunneling (SET) technology introduces more potential for feature size reduction compared with well-established silicon-based CMOS technology. The SET technology offers the ability... View More

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