IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of Line width with Nano Fountain Pen Using Active Membrane Pumping

2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems

Author(s): Kyoil Hwang ; Van-Due Dinh ; Suk-Han Lee ; Youn-Jea Kim ; Hun-Mo Kim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Bangkok, Thailand
Conference Date: 16 January 2007
Page(s): 759 - 763
ISBN (Paper): 1-4244-0610-2
DOI: 10.1109/NEMS.2007.352128
Regular:

The intention of this research was investigated the line width that is written by NFP (nano fountain pen) using active membrane pumping in order to understand how to control it. The relationships... View More

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