IEEE - Institute of Electrical and Electronics Engineers, Inc. - Empirical and statistical analysis of risk analysis-driven techniques for threat management

Second International Conference on Availability, Reliability and Security (ARES'07)

Author(s): K. Buyens ; B. De Win ; W. Joosen
Sponsor(s): ENISA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2007
Conference Location: Vienna, Austria
Conference Date: 10 April 2007
Page(s): 1,034 - 1,041
ISBN (Paper): 0-7695-2775-2
DOI: 10.1109/ARES.2007.78
Regular:

One of the challenges of secure software construction (and maintenance) is to get control over the multitude of threats in order to focus mitigation efforts on the most relevant ones. Risk... View More

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