IEEE - Institute of Electrical and Electronics Engineers, Inc. - Empowering ASIC Front-End to Meet the Challenges of the Ultra Deep Sub-Micrometer

2007 International Conference on Signal Processing, Communications and Networking

Author(s): Vaidyanathan K ; Radhakrishnan A ; K. Suriya Kumar ; M. Kannan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2007
Conference Location: Chennai, India
Conference Date: 22 February 2007
Page(s): 392 - 397
ISBN (CD): 1-4244-0997-7
ISBN (Paper): 1-4244-0996-9
DOI: 10.1109/ICSCN.2007.350769
Regular:

The major problem posed by very deep sub-micrometer is the inaccuracies which it introduces into the conventional electronic design automation tool estimates. The estimates of power and speed... View More

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