IEEE - Institute of Electrical and Electronics Engineers, Inc. - Process Capability Analysis for Non-Normal Quality Characteristics Using Gamma Distribution

2007 4th International Conference on Information Technology New Generations

Author(s): S. Ahmad ; M. Abdollahian ; P. Zeephongsekul
Sponsor(s): Premier Hall for Sci. and Eng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2007
Conference Location: Las Vegas, NV, USA
Conference Date: 2 April 2007
Page(s): 425 - 430
ISBN (Paper): 0-7695-2776-0
DOI: 10.1109/ITNG.2007.158
Regular:

In today's ultra competitive business environment, it is becoming more critical than ever to assess precisely process losses due to non-compliance of customer specifications. To assess these... View More

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