IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Simple Flip-Flop Circuit for Typical-Case Designs for DFM

2007 IEEE International Symposium on Quality of Electronic Design

Author(s): T. Sato ; Y. Kunitake
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: San Jose, CA, USA
Conference Date: 26 March 2007
Page(s): 539 - 544
ISBN (Paper): 0-7695-2795-7
DOI: 10.1109/ISQED.2007.23
Regular:

The deep submicron (DSM) semiconductor technologies make the worst-case design impossible, since they can not provide design margins that it requires. Research directions should go to typical-case... View More

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