IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fully Digital Optimized Testing and Calibration Technique for \Sigma \Delta ADC's

2007 IEEE International Symposium on Quality of Electronic Design

Author(s): D. de Venuto ; L. Reyneri
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: San Jose, CA, USA
Conference Date: 26 March 2007
Page(s): 519 - 526
ISBN (Paper): 0-7695-2795-7
ISSN (Electronic): 1948-3295
ISSN (Paper): 1948-3287
DOI: 10.1109/ISQED.2007.80
Regular:

This work describes a novel test strategy that uses digital stimuli for cheap, fast, though accurate, testing of high resolution SigmaDelta ADC's. Simulation results showed a detection sensitivity... View More

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