IEEE - Institute of Electrical and Electronics Engineers, Inc. - Achieving Low-Cost Linearity Test and Diagnosis of \Sigma \Delta ADCs via Frequency-Domain Nonlinear Analysis and Macromodeling

2007 IEEE International Symposium on Quality of Electronic Design

Author(s): GuoYu ; Pena Li ; Wei Dona
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: San Jose, CA, USA
Conference Date: 26 March 2007
Page(s): 513 - 518
ISBN (Paper): 0-7695-2795-7
DOI: 10.1109/ISQED.2007.28
Regular:

Static linearity test of SigmaDelta analog-to-digital converters (ADCs) imposes stringent requirement on the precision of test signals and leads to excessive test time. Consequently, ADC test... View More

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