IEEE - Institute of Electrical and Electronics Engineers, Inc. - InVerS: An Incremental Verification System with Circuit Similarity Metrics and Error Visualization

2007 IEEE International Symposium on Quality of Electronic Design

Author(s): Kai-hui Chang ; D.A. Papa ; I.L. Markov ; V. Bertacco
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: San Jose, CA, USA
Conference Date: 26 March 2007
Page(s): 487 - 494
ISBN (Paper): 0-7695-2795-7
DOI: 10.1109/ISQED.2007.94
Regular:

Dramatic increases in design complexity and advances in IC manufacturing technology affect all aspects of circuit performance and functional correctness. As interconnect increasingly dominates... View More

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