IEEE - Institute of Electrical and Electronics Engineers, Inc. - Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays

2007 IEEE International Symposium on Quality of Electronic Design

Author(s): D. De Venuto ; B. Ricco
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2007
Conference Location: San Jose, CA, USA
Conference Date: 26 March 2007
Page(s): 311 - 316
ISBN (Paper): 0-7695-2795-7
DOI: 10.1109/ISQED.2007.90
Regular:

This paper presents a fault analysis applied to a novel optical, label-free sensors array for DNA detection. The IFA approach to extract and model the possible defects has been used. A critical... View More

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