IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application-Level Correctness and its Impact on Fault Tolerance

2007 IEEE 13th International Symposium on High Performance Computer Architecture

Author(s): Xuanhua Li ; D. Yeung
Sponsor(s): IEEE Comput. Soc. Tech. Comm. on Comput. Archit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2007
Conference Location: Scottsdale, AZ, USA
Conference Date: 10 February 2007
Page(s): 181 - 192
ISBN (CD): 1-4244-0805-9
ISBN (Paper): 1-4244-0804-0
DOI: 10.1109/HPCA.2007.346196
Regular:

Traditionally, fault tolerance researchers have required architectural state to be numerically perfect for program execution to be correct. However, in many programs, even if execution is not 100%... View More

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