IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Aging Hypothesis Test for Army Systems

2007 Annual Reliability and Maintainability Symposium

Author(s): J. Nierwinski ; D. Pollack ; R. Ankam
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Orlando, FL, USA
Conference Date: 22 January 2007
Page(s): 440 - 445
ISBN (CD): 0-7803-9767-3
ISBN (Paper): 0-7803-9766-5
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2007.328111
Regular:

This paper develops a parametric approach that analyzes trends between age, in terms of year of manufacture (YoM), of an Army system and its respective parts cost per mile (PCM) within a... View More

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