IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic Reliability Block Diagrams VS Dynamic Fault Trees

2007 Annual Reliability and Maintainability Symposium

Author(s): S. Distefano ; A. Puliafito
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Orlando, FL, USA
Conference Date: 22 January 2007
Page(s): 71 - 76
ISBN (CD): 0-7803-9767-3
ISBN (Paper): 0-7803-9766-5
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2007.328095
Regular:

Reliability block diagrams (RBD), and fault trees (FT) are the most widely used formalisms in system reliability modeling. They implement two different approaches: in a reliability block diagram,... View More

Advertisement