IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling Expert Judgment for Reliability Prediction - Comparison of Methods

2007 Annual Reliability and Maintainability Symposium

Author(s): A. Mannhart ; A. Bilgic ; B. Bertsche
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Orlando, FL, USA
Conference Date: 22 January 2007
Page(s): 1 - 6
ISBN (CD): 0-7803-9767-3
ISBN (Paper): 0-7803-9766-5
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2007.328099
Regular:

This paper presents an introduction into methods for representing and modeling expert judgment for reliability prediction in early stages of product development process. It provides a survey of... View More

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