IEEE - Institute of Electrical and Electronics Engineers, Inc. - Extraction of Effective Carrier Velocity in RF MOSFETs

2007 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems

Author(s): Yeonam Yun ; In Man Kang ; Byung-Gook Park ; Jong Duk Lee ; Hyungcheol Shin
Sponsor(s): IEEE Microwave Theory and Tech. Soc
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Long Beach, CA, USA
Conference Date: 10 January 2007
Page(s): 72 - 75
ISBN (CD): 0-7803-9765-7
ISBN (Paper): 0-7803-9764-9
DOI: 10.1109/SMIC.2007.322772
Regular:

A more accurate method based on the actual inversion charge measurement in this paper is proposed to extract the effective carrier velocity in RF MOSFETs. This method uses the gate-drain intrinsic... View More

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