IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of RealTime Embedded Applications in the Presence of a Stochastic Fault Model

2007 20th International Conference on VLSI Design

Author(s): R. Sridharan ; R. Mahapatra
Sponsor(s): VLSI Soc. of India
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Bangalore, India
Conference Date: 6 January 2007
Page(s): 83 - 88
ISBN (Paper): 0-7695-2762-0
ISSN (Electronic): 2380-6923
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSID.2007.36
Regular:

Real-time embedded systems are characterized by their need to complete task executions within their scheduled deadlines. Task scheduling could get complicated due to the occurrence of faults in... View More

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