IEEE - Institute of Electrical and Electronics Engineers, Inc. - Unified Architecture for Large-Scale Attested Metering

Proceedings of the 40th Annual Hawaii International Conference on System Sciences

Author(s): M. LeMay ; G. Gross ; C.A. Gunter ; S. Garg
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2007
Conference Location: Waikoloa, HI, USA
Conference Date: 3 January 2007
Page(s): 115
ISBN (Online): 0-7695-2755-8
ISSN (Online): 1530-1605
DOI: 10.1109/HICSS.2007.586
Regular:

We introduce a secure architecture called an attested meter/or advanced metering that supports large-scale deployments, flexible configurations, and enhanced protection for consumer privacy and... View More

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