IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performance evaluation of k out of n detector

2006 14th European Signal Processing Conference

Author(s): Yaser Norouzi ; Maria S. Greco ; Mohammad M. Nayebi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2006
Conference Location: Florence, Italy
Conference Date: 4 September 2006
Page(s): 1 - 5
ISSN (Paper): 2219-5491
Regular:

In this paper the problem of k out of n detection, between sequence of M random bits is addressed. The main application of the result is in a radar system, when we want to detect a target (with... View More

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