IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault diagnosis method using a signed digraph for multiple origins of failures - evaluation of the diagnosis accuracy -

2006 IEEE Conference on Computer Aided Control System Design, 2006 IEEE International Conference on Control Applications, 2006 IEEE International Symposium on Intelligent Control

Author(s): S. Tateno ; H. Matsuyama ; Y. Tsuge
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Munich, Germany
Conference Date: 4 October 2006
Page(s): 3,271 - 3,276
ISBN (CD): 0-7803-9797-5
DOI: 10.1109/CACSD-CCA-ISIC.2006.4777162
Regular:

A fault diagnosis algorithm using a signed digraph as a model of a system is useful to real-time diagnosis of failures that occur in a chemical plant. It has been improved so much that it can find... View More

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