IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Monte Carlo analysis of VNA-based time domain uncertainties

2006 67th ARFTG Conference

Author(s): J. Martens
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2006
Conference Location: San Francisco, CA, USA
Conference Date: 16 June 2006
Page(s): 111 - 120
ISBN (Paper): 978-0-7803-9529-9
DOI: 10.1109/ARFTG.2006.4734355
Regular:

While VNA-based time domain measurements have been in use for decades, an uncertainty analysis has often been limited to the concept of an `average-+ of frequency domain uncertainties. There is... View More

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