IEEE - Institute of Electrical and Electronics Engineers, Inc. - Entanglement of trapped ions

2006 Conference on Lasers & Electro-Optics/Quantum Electronics and Laser Science Conference (CLEO/QELS)

Author(s): C. Becher ; H. Barros ; J. Benhelm ; D. Chek-al-Kar ; M. Chwalla ; H. Haffner ; W. Hansel ; T. Korber ; T. Monz ; E.S. Phillips ; U.D. Rapol ; M. Riebe ; C. Roos ; C. Russo ; P.O. Schmidt ; O. Guhne ; W. Dur ; R. Blatt
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2006
Conference Location: Long Beach, CA, USA
Conference Date: 21 May 2006
Page(s): 1 - 2
ISBN (CD): 978-1-55752-813-1
DOI: 10.1109/CLEO.2006.4629048
Regular:

We report on the scalable and deterministic generation and tomographic characterization of entangled states of up to 8 trapped ions and experiments towards entangling ions and photons.

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