IEEE - Institute of Electrical and Electronics Engineers, Inc. - What is the optimum way to extract information from optical images at the standard quantum limit and beyond ?

2006 Conference on Lasers & Electro-Optics/Quantum Electronics and Laser Science Conference (CLEO/QELS)

Author(s): C. Fabre ; N. Treps ; V. Delaubert ; H.A. Bachor ; P. Refregier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2006
Conference Location: Long Beach, CA, USA
Conference Date: 21 May 2006
Page(s): 1 - 2
ISBN (CD): 978-1-55752-813-1
DOI: 10.1109/CLEO.2006.4629003
Regular:

The problem of extracting a given piece of information from an image with the maximum sensitivity is solved in the general case. Implementations using image intensity processing techniques and... View More

Advertisement