IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bias-Dependent Model of Microwave FET S-parameters Based on Prior Knowledge ANNs

2006 8th Seminar on Neural Network Applications in Electrical Engineering

Author(s): Z.D. Marinkovic ; O.R. Pronic ; V.V. Markovic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2006
Conference Location: Belgrade, Serbia & Montenegro, Serbia
Conference Date: 25 September 2006
Page(s): 185 - 188
ISBN (CD): 1-4244-0433-9
ISBN (Paper): 1-4244-0432-0
DOI: 10.1109/NEUREL.2006.341208
Regular:

The applications of artificial neural networks (ANNs) in bias-dependent modeling of S-parameters of microwave FETs have been proposed earlier. Here, a model based on an ANN with additional prior... View More

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