IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simultaneous Analysis of Capacitive Coupling and Leakage Noise in Nanometer Scale Circuits

APCCAS 2006. 2006 IEEE Asia Pacific Conference on Circuits and Systems

Author(s): C.M. Tan ; M.H. Chowdhury
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2006
Conference Location: Singapore, Singapore
Conference Date: 4 December 2006
Page(s): 2,004 - 2,007
ISBN (Paper): 1-4244-0387-1
DOI: 10.1109/APCCAS.2006.342281
Regular:

Traditional analysis deals with one noise source at a time. However, in nanometer scale circuits the evolving reality of multiple noise sources interacting with each other must be considered,... View More

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