IEEE - Institute of Electrical and Electronics Engineers, Inc. - Accurate and Fast Estimation of Junction Band-to-Band Leakage in Nanometer-Scale MOSFET

APCCAS 2006. 2006 IEEE Asia Pacific Conference on Circuits and Systems

Author(s): Hong Luo ; Huazhong Yang ; Rong Luo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2006
Conference Location: Singapore, Singapore
Conference Date: 4 December 2006
Page(s): 956 - 959
ISBN (Paper): 1-4244-0387-1
DOI: 10.1109/APCCAS.2006.342220
Regular:

The estimation and optimization of leakage power become more and more important with technology scalling. Besides subthreshold and gate leakage, the band-to-band (BTBT) junction leakage plays a... View More

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