IEEE - Institute of Electrical and Electronics Engineers, Inc. - Techniques of Power-gating to Kill Sub-Threshold Leakage

APCCAS 2006. 2006 IEEE Asia Pacific Conference on Circuits and Systems

Author(s): Changbo Long ; Jinjun Xiong ; Yongpan Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2006
Conference Location: Singapore, Singapore
Conference Date: 4 December 2006
Page(s): 952 - 955
ISBN (Paper): 1-4244-0387-1
DOI: 10.1109/APCCAS.2006.342219
Regular:

Sub-threshold leakage has increased dramatically with technology scaling, and it already consumes a significant portion of the total power budget in current high-end chip designs. This paper... View More

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