IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simulation Study on an Ultra-High Resolution SPECT with CdTe Detectors

2006 IEEE Nuclear Science Symposium Conference Record

Author(s): K. Ogawa ; M. Muraishi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: San Diego, CA, USA
Conference Date: 29 October 2006
Volume: 4
Page(s): 2,421 - 2,425
ISBN (CD): 1-4244-0561-0
ISBN (Paper): 1-4244-0560-2
ISSN (Paper): 1095-7863
DOI: 10.1109/NSSMIC.2006.354401
Regular:

The development of semiconductor detectors such as CdTe and CdZnTe which work at room temperature enables us to realize a new SPECT system. These semiconductor detectors have a high energy... View More

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