IEEE - Institute of Electrical and Electronics Engineers, Inc. - Critical densities in hard sphere packings. Delaunay simplex analysis.

2006 3rd International Symposium on Voronoi Diagrams in Science and Engineering

Author(s): A.V. Anikeenko ; N.N. Medvedev ; A. Elsner ; K. Lochmann ; D. Stoyan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2006
Conference Location: Banff, Alberta, BC, Canada
Conference Date: 2 July 2006
Page(s): 153 - 158
ISBN (Paper): 0-7695-2630-6
DOI: 10.1109/ISVD.2006.17
Regular:

A large set of computer models (more then 200 models) of hard sphere packings with packing fraction eta between 0.52 - 0.72 is examined. Every packing consist of 10.000 identical spheres in the... View More

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