IEEE - Institute of Electrical and Electronics Engineers, Inc. - Synthetic Aperture Focusing Technique in High - Frequency Ultrasound Imaging to Locate Layer Delamination

IEEE Instrumentation and Measurement Technology Conference

Author(s): S.J. Rupitsch ; F. Maier ; B.G. Zagar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,953 - 1,958
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328319
Regular:

In this proposed paper the synthetic aperture focusing technique (SAFT) is applied to extend the depth of focus for spherically focused ultrasound transducers. This technique uses a virtual source... View More

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