IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement Technique for the Static Output Characterisation of High Current Power MOSFETs

IEEE Instrumentation and Measurement Technology Conference

Author(s): T. Lopez ; R. Elferich
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,879 - 1,884
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328285
Regular:

A technique for measuring the static output characteristics of high current power MOSFETs is presented. The approach aims at the mitigation of self-heating, which is the source of significant... View More

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