IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Histogram Test of ADCs is Unbiased by Phase Noise

IEEE Instrumentation and Measurement Technology Conference

Author(s): F.C. Alegria ; A.C. Serra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2006
Conference Location: Sorrento, Italy
Conference Date: 24 April 2006
Page(s): 1,639 - 1,642
ISBN (CD): 0-7803-9360-0
ISBN (Paper): 0-7803-9359-7
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2006.328186
Regular:

It is shown here that the presence of phase noise or jitter in the test setup or in the ADC itself does not cause a bias in the transfer function estimation using the histogram test. The ADC... View More

Advertisement